Optical and microwave properties of metal-insulator thin films: possibility of light localization

Andrey K. Sarychev, David J. Bergman and Yoad Yagil

Physica A: Statistical Mechanics and its Applications, 1994, vol. 207, issue 1, 372-378

Abstract: High frequency response (optical, infrared and microwave) of thin metal-dielectric inhomogeneous films is studied. We propose a new approach based on a direct solution of Maxwell's equations without having to invoke the quasi-static approximation. Our theory reproduces most of the known experimental results including the anomalous absorption near a percolation threshold. For the strong skin effect case or for superconducting-dielectric films we predict an electromagnetic wave localisation at the percolation threshold.

Date: 1994
References: View complete reference list from CitEc
Citations:

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/0378437194903980
Full text for ScienceDirect subscribers only. Journal offers the option of making the article available online on Science direct for a fee of $3,000

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:207:y:1994:i:1:p:372-378

DOI: 10.1016/0378-4371(94)90398-0

Access Statistics for this article

Physica A: Statistical Mechanics and its Applications is currently edited by K. A. Dawson, J. O. Indekeu, H.E. Stanley and C. Tsallis

More articles in Physica A: Statistical Mechanics and its Applications from Elsevier
Bibliographic data for series maintained by Catherine Liu ().