X-ray scattering studies of crystallization, growth and wetting phenomena at surfaces

S.K. Sinha

Physica A: Statistical Mechanics and its Applications, 1996, vol. 224, issue 1, 140-152

Abstract: X-ray scattering has proven to be a very powerful probe in investigating the structure and morphology of surfaces, interfaces and thin films. In this paper, we review some recent applications of the technique to study phenomena such as the scaling properties of films growing on a substrate, surface crystallization phenomena in hydrocarbons, and the wetting of inhomogeneous surfaces by liquid films.

Date: 1996
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:224:y:1996:i:1:p:140-152

DOI: 10.1016/0378-4371(95)00392-4

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