Critical interface in two dimensions

M. Robert, I. Reaney and P. Stadelmann

Physica A: Statistical Mechanics and its Applications, 1996, vol. 229, issue 1, 47-52

Abstract: The interface separating two-dimensional phases close to a critical point is observed in the ferroelectric BaZrxTi1−xO3 by transmission electron microscopy. The temperature dependence of the interfacial thickness is determined and compared with theoretical predictions.

Keywords: Interface; Two-dimensional systems; Critical point; Universality (search for similar items in EconPapers)
Date: 1996
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:229:y:1996:i:1:p:47-52

DOI: 10.1016/0378-4371(96)00033-7

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