Off-specular X-ray scattering studies of the morphology of thin films

S.K. Sinha, Y.P. Feng, C.A. Melendres, D.D. Lee, T.P. Russell, S.K. Satija, E.B. Sirota and M.K. Sanyal

Physica A: Statistical Mechanics and its Applications, 1996, vol. 231, issue 1, 99-110

Abstract: We discuss the scattering of X-rays from thin films at a surface or interface decorated with a morphology of islands and how these effects manifest themselves in the specular reflectivity and the diffuse (off-specular) scattering. We show how this technique has been used to study block copolymer films decorated with islands on the surface and the development of electrochemically induced pitting on a Cu electrode in an electrolyte solution.

Date: 1996
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:231:y:1996:i:1:p:99-110

DOI: 10.1016/0378-4371(96)00085-4

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