Surface enhanced resonant Raman scattering induced by silver thin films close to the percolation threshold

Patrice Gadenne, Dorothée Gagnot and Michèle Masson

Physica A: Statistical Mechanics and its Applications, 1997, vol. 241, issue 1, 161-165

Abstract: The electromagnetic field of an incoming wave has already been found to be enhanced close to the surface of a thin granular or rough silver film. We use Surface Enhanced Resonant Raman Scattering (SERRS) as a test of this enhancement close to the percolation threshold (pc). The scattered light shows a maximum below pc, then a minimum close to pc and goes up above.

Keywords: Granular thin films; Rough surface; Resonant Raman scattering; Percolation threshold (search for similar items in EconPapers)
Date: 1997
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:241:y:1997:i:1:p:161-165

DOI: 10.1016/S0378-4371(97)00076-9

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