Statistical mechanics of dielectric breakdown

J.L. Vicente, A.C. Razzitte, M.C. Cordero and E.E. Mola

Physica A: Statistical Mechanics and its Applications, 1998, vol. 261, issue 3, 309-316

Abstract: A statistical picture of dielectric breakdown in solids is presented and discussed in this paper. The morphology selection mechanism is described by the stochastic model or η model. The approach is formulated in terms of two functions α(η) and β(η), which play the role of a free energy and that of an inverse temperature, respectively. Numerical evidence for a description of the probability distribution of branched structures grown on a square lattice is reported.

Keywords: Dielectric breakdown; Branched structures; Electrical tree (search for similar items in EconPapers)
Date: 1998
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:261:y:1998:i:3:p:309-316

DOI: 10.1016/S0378-4371(98)00316-1

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