Thermal effects on the electrical degradation of thin film resistors

C. Pennetta, L. Reggiani and L.B. Kiss

Physica A: Statistical Mechanics and its Applications, 1999, vol. 266, issue 1, 214-217

Abstract: Recently we introduced a biased percolation model to study the electrical failure of thin-film resistors. Here we extend this model by allowing thermal interactions among first neighbour elemental resistances and accounting for the dependence of each elemental resistance on the local temperature. Monte Carlo simulations are performed to investigate the main properties of the film degradation such as: damage pattern, film lifetime, evolution of the resistance and of the 1/f resistance–noise spectrum.

Keywords: Percolation models; 1/f electrical noise; Thin film failure (search for similar items in EconPapers)
Date: 1999
References: View complete reference list from CitEc
Citations: View citations in EconPapers (2)

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0378437198005949
Full text for ScienceDirect subscribers only. Journal offers the option of making the article available online on Science direct for a fee of $3,000

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:266:y:1999:i:1:p:214-217

DOI: 10.1016/S0378-4371(98)00594-9

Access Statistics for this article

Physica A: Statistical Mechanics and its Applications is currently edited by K. A. Dawson, J. O. Indekeu, H.E. Stanley and C. Tsallis

More articles in Physica A: Statistical Mechanics and its Applications from Elsevier
Bibliographic data for series maintained by Catherine Liu ().