Multifractal analysis and scaling range of ZnO AFM images

Xia Sun, Zhuxi Fu and Ziqin Wu

Physica A: Statistical Mechanics and its Applications, 2002, vol. 311, issue 3, 327-338

Abstract: The surface topographies of as-sputtered and annealed ZnO films were measured by atomic force microscope (AFM). Multifractal behavior of AFM images has been analyzed by box-counting method. It is found that the scaling range can be extended from the image size to the smallest pixel (about 3 decades) by selecting an appropriate method for determining height probability and neglecting smallest probabilities (totally <0.2%) in several boxes. Multifractal spectra can be used to characterize the rough surface of thin film quantitatively.

Keywords: Scaling range; AFM images; Multifractal (search for similar items in EconPapers)
Date: 2002
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Citations: View citations in EconPapers (1)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:311:y:2002:i:3:p:327-338

DOI: 10.1016/S0378-4371(02)00820-8

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