 Determination of the fractal dimension of equipotential surfaces in a region confined by rough conductorsH. de O. Dias Filho, C.M.C. de Castilho, J.G.V. Miranda and R.F.S. Andrade Physica A: Statistical Mechanics and its Applications, 2004, vol. 342, issue 1, 388-394 Abstract: We consider a region bounded by two conductors held to a constant voltage bias, one of them with an irregular rough shape and the other being a flat one. The irregular profile can be either a curve with a formation rule or the result of a deposition process. The rough shape of the profile influences the equipotential lines, which we have characterized by numerically evaluating their roughness exponent α and fractal dimension Df. For a fixed finite size system, the less corrugated lines, far away from the rough profile, have higher α. For a line corresponding to a fixed value of the potential, the roughness exponent decreases with the size of the profile, suggesting that a single constant value characterizes all lines for an infinite system. Keywords: Fractal Dimension; Surfaces; Laplace's equation (search for similar items in EconPapers) Downloads: (external link) Related works: Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:342:y:2004:i:1:p:388-394 DOI: 10.1016/j.physa.2004.04.099 Access Statistics for this article Physica A: Statistical Mechanics and its Applications is currently edited by K. A. Dawson, J. O. Indekeu, H.E. Stanley and C. Tsallis More articles in Physica A: Statistical Mechanics and its Applications from Elsevier |
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