Roughness in the Kolmogorov–Johnson–Mehl–Avrami framework: extension to (2+1)D of the Trofimov–Park model

Barbara Pacchiarotti, Massimo Fanfoni and Massimo Tomellini

Physica A: Statistical Mechanics and its Applications, 2005, vol. 358, issue 2, 379-392

Abstract: In this paper the reformulation of Trofimov–Park (TP) model, [V.I. Trofimov, Appl. Surf. Sci. 219 (2003) 93), of thin film roughness evolution during nucleation and growth of islands in case of simultaneous nucleation is presented. The calculation of TP restricted to one-dimensional triangular islands has been extended to both the one-dimensional elliptical case and to the pyramidal two-dimensional one. The kinetics of the interface width, w, and the height–height autocorrelation function G, through which the correlation length ξ has been defined, have been estimated. Moreover, w(Θ) and ξ(Θ), where Θis the fraction of the covered substrate, if properly rescaled to the density of nuclei N and to the aspect ratio of islands, are universal functions that, for a conspicuous range of Θ, obey a power law with the exponent depending upon island shape.

Keywords: Surface roughness; Autocorrelation function; Thin film morphology (search for similar items in EconPapers)
Date: 2005
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:358:y:2005:i:2:p:379-392

DOI: 10.1016/j.physa.2005.04.041

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