Structural complexity of disordered surfaces: Analyzing the porous silicon SFM patterns

R.R. Rosa, M.P.M.A. Baroni, G.T. Zaniboni, A. Ferreira da Silva, L.S. Roman, J. Pontes and M.J.A. Bolzan

Physica A: Statistical Mechanics and its Applications, 2007, vol. 386, issue 2, 666-673

Abstract: This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.

Keywords: Disordered surfaces; Structural complexity; Gradient pattern analysis; Wavelet multiresolution analysis; Euler characteristic; KPZ equation; Porous silicon (search for similar items in EconPapers)
Date: 2007
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:386:y:2007:i:2:p:666-673

DOI: 10.1016/j.physa.2007.08.044

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