Effects of electromigration on copper atoms in carbon nanotube channels

M.C.G. Lim and Z.W. Zhong

Physica A: Statistical Mechanics and its Applications, 2011, vol. 390, issue 5, 963-971

Abstract: The effects of electromigration on copper in carbon nanotube (CNT) channels are investigated using molecular dynamics simulations. The study shows that the potential energy of copper and the resistive forces on copper are dependent on the shape of the CNT junction, and the increase in bias voltages magnifies these effects. Bias voltages affect the density of copper in the downstream CNT. The velocity of copper in the downstream CNT is relatively lower than that in the upstream CNT when the biased voltage is high.

Keywords: Carbon nanotube channel; Copper atoms; Electromigration; Molecular dynamics (search for similar items in EconPapers)
Date: 2011
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:390:y:2011:i:5:p:963-971

DOI: 10.1016/j.physa.2010.11.028

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