Characterization of nanostructured material images using fractal descriptors
João B. Florindo,
Mariana S. Sikora,
Ernesto C. Pereira and
Odemir M. Bruno
Physica A: Statistical Mechanics and its Applications, 2013, vol. 392, issue 7, 1694-1701
Abstract:
This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image texture (mathematical surface) by the volumetric fractal descriptors, a methodology based on the Bouligand–Minkowski fractal dimension, which considers the properties of the Minkowski dilation of the surface points. An experiment with galvanostatic anodic titanium oxide samples prepared in oxalyc acid solution using different conditions of applied current, oxalyc acid concentration and solution temperature was performed. The results demonstrate that the approach is capable of characterizing complex morphology characteristics such as those present in the anodic titanium oxide.
Keywords: FEG images; Nanoscale materials; Pattern recognition; Fractal dimension; Fractal descriptors; Image analysis (search for similar items in EconPapers)
Date: 2013
References: View complete reference list from CitEc
Citations: View citations in EconPapers (4)
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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:392:y:2013:i:7:p:1694-1701
DOI: 10.1016/j.physa.2012.11.020
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