Lacunarity exponent and Moran index: A complementary methodology to analyze AFM images and its application to chitosan films

Erveton P. Pinto, Marcelo A. Pires, Robert S. Matos, Robert R.M. Zamora, Rodrigo P. Menezes, Raquel S. Araújo and Tiago M. de Souza

Physica A: Statistical Mechanics and its Applications, 2021, vol. 581, issue C

Abstract: In this work, we developed new scripts to calculate the lacunarity exponent and Moran’s index of Atomic Force Microscopy (AFM) images. The lacunarity exponent was estimated by combining the Otsu binarization and gliding-box algorithm, and Moran index was introduced to evaluate the surfaces’ spatial autocorrelation. Developed scripts were first validated using numerical simulation of self-similar fractal and self-affine isotropic surfaces. Then, we successfully synthesized chitosan films with different glycerol concentrations and used the lacunarity and Moran’s index for a thorough characterization. The validation of the proposed scripts using simulated Sierpinski Carpets and 3D artificial surfaces showed promising potential for analyzing AFM images. Finally, the methodology application to AFM images of chitosan films suggested that lacunarity analysis and Moran index determination could complement thin films’ quality processing control.

Keywords: Fractal lacunarity; Spatial autocorrelation; Surface topography; Polymeric films; Glycerol (search for similar items in EconPapers)
Date: 2021
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (2)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:phsmap:v:581:y:2021:i:c:s0378437121004659

DOI: 10.1016/j.physa.2021.126192

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