Influence of the temperature on the intrinsic parameters of thin-film photovoltaic modules

Michel Piliougine, Luis Enrique Garcia-Marrero, Kari Lappalainen and Giovanni Spagnuolo

Renewable Energy, 2025, vol. 240, issue C

Abstract: The electrical parameters, the ideality diode factor and the parasitic resistances of a photovoltaic module can be estimated from its current–voltage (I–V) curve. However, there are only very few studies focused on thin-film devices, that could have a thermal behavior different from crystalline silicon technologies. This study analyzes the variation of these parameters from a set of current–voltage curves of several commercial modules from different technologies: single-crystalline silicon (sc-Si), multi-crystalline silicon (mc-Si), amorphous silicon (a-Si), tandem of micro-crystalline silicon and amorphous silicon (a-Si/μc-Si), tandem of cadmium selenide and cadmium telluride (CdS/CdTe), and copper indium selenide (CIS).

Keywords: Diode ideality factor; Thin film; Parallel resistance; Series resistance; Single diode model (search for similar items in EconPapers)
Date: 2025
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0960148124021360
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:renene:v:240:y:2025:i:c:s0960148124021360

DOI: 10.1016/j.renene.2024.122068

Access Statistics for this article

Renewable Energy is currently edited by Soteris A. Kalogirou and Paul Christodoulides

More articles in Renewable Energy from Elsevier
Bibliographic data for series maintained by Catherine Liu ().