Optical and structural properties of sputtered CdTe thin films

H. Mohssine, F. Debbagh, E.L. Ameziane and A. Bennouna

Renewable Energy, 1994, vol. 5, issue 1, 205-208

Abstract: The structural and optical properties of polycrystalline CdTe thin films are investigated. The films were grown by the standard rf sputtering technique using high purity (5N) CdTe target. X-ray diffraction studies are performed in order to determine structure and texture of samples. It is found that the as grown films show a mixture between hexagonal and cubic phases. It should be noted that the preferential direction of crystallites changes with changing deposition parameters.

Date: 1994
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Persistent link: https://EconPapers.repec.org/RePEc:eee:renene:v:5:y:1994:i:1:p:205-208

DOI: 10.1016/0960-1481(94)90372-7

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