Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells

R. Kishore, H.R. Moutinho and B.L. Sopori

Renewable Energy, 1995, vol. 6, issue 5, 589-591

Abstract: Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance.

Date: 1995
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Persistent link: https://EconPapers.repec.org/RePEc:eee:renene:v:6:y:1995:i:5:p:589-591

DOI: 10.1016/0960-1481(95)00054-N

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