EconPapers    
Economics at your fingertips  
 

Is there a tradeoff between average patent pendency and examination errors?

Amitrajeet Batabyal and Peter Nijkamp

International Review of Economics & Finance, 2008, vol. 17, issue 1, 150-158

Date: 2008
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (10)

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S1059-0560(06)00056-6
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:reveco:v:17:y:2008:i:1:p:150-158

Access Statistics for this article

International Review of Economics & Finance is currently edited by H. Beladi and C. Chen

More articles in International Review of Economics & Finance from Elsevier
Bibliographic data for series maintained by Catherine Liu ().

 
Page updated 2025-03-23
Handle: RePEc:eee:reveco:v:17:y:2008:i:1:p:150-158