Use of Short‐run Statistical Process Control Techniques: A Comparison of JIT and Non‐JIT Manufacturing

Gyu C. Kim and Marc J. Schniederjans

American Journal of Business, 2000, vol. 15, issue 2, 77-84

Abstract: Keywords: Short‐run statistical processes, SPC techniques, Just‐in‐time manufacturing, Control techniques

Date: 2000
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Persistent link: https://EconPapers.repec.org/RePEc:eme:ajbpps:19355181200000013

DOI: 10.1108/19355181200000013

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