Digital Image Analysis of Low-Temperature Responses in Sweet Corn Hybrid Seedlings

Tae-Chun Park, Seunghyun Wang, Jongwon Kang, Minjeong Kang, Jong-Wook Chung () and Yoon-Sup So ()
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Tae-Chun Park: Department of Agronomy, Iowa State University, Ames, IA 50011-1051, USA
Seunghyun Wang: Gangwon-do Agricultural Research and Extension Services, Maize Research Institute, Hongcheon 25160, Republic of Korea
Jongwon Kang: Department of Plant Agriculture, University of Guelph, Guelph, ON N1G 2W1, Canada
Minjeong Kang: Department of Agronomy, Iowa State University, Ames, IA 50011-1051, USA
Jong-Wook Chung: Department of Industrial Plant Science and Technology, Chungbuk National University, Cheongju 28644, Republic of Korea
Yoon-Sup So: Department of Crop Science, Chungbuk National University, Cheongju 28644, Republic of Korea

Agriculture, 2024, vol. 14, issue 3, 1-14

Abstract: Breeding for stress-tolerant hybrids begins with screening germplasm for tolerant genotypes. We employed a non-destructive and objective method to evaluate the low-temperature response of sweet corns at the seedling stage, using a digital image analysis. It was estimated using summed leaf area, a new parameter defined as the sum of the leaf area measured from images taken at different angles. The summed leaf area, SPAD, shoot and root fresh weight, and total root length were significantly different among hybrids. The group mean of sugary endosperm type was significantly higher than that of shrunken type for all traits but SPAD. For the summed leaf area, the top three ranked hybrids were from the sugary type, but the area for the following three hybrids from the shrunken type did not differ from that for the first three hybrids. The summed leaf area was correlated with SPAD (r = 0.49 **), shoot (r = 0.99 **) and root (r = 0.93 **) fresh weight, and total root length (r = 0.76 **). Phytoglycogen in seeds only had a significant correlation (r = 0.46 **) with the area. The summed leaf area of only one hybrid differed between normal- and low-temperature conditions. The low-temperature response based on the summed leaf area was reflected in the field condition, with a few exceptions. The results suggest that the summed leaf area via digital image analysis can be used to evaluate low-temperature response in sweet corns.

Keywords: sweet corn; cold tolerance; digital image analysis; summed leaf area (search for similar items in EconPapers)
JEL-codes: Q1 Q10 Q11 Q12 Q13 Q14 Q15 Q16 Q17 Q18 (search for similar items in EconPapers)
Date: 2024
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