Lot Sizing to Reduce Capacity Utilization in a Production Process with Defective Items, Process Corrections, and Rework

Hau L. Lee
Additional contact information
Hau L. Lee: Department of Industrial Engineering and Engineering Management, Stanford University, Stanford, California 94305

Management Science, 1992, vol. 38, issue 9, 1314-1328

Abstract: This paper deals with the lot sizing problem in which the key features of imperfections in a production process are explicitly modelled. These features include: process shifting to out-of-control states, detection of the out-of-control shifts, corrective actions following the detections, and the fixed setup and variable processing times of reworks. The problem is motivated by the wafer probe operation in semiconductor manufacturing. The key objective that drives the lot sizing decision is to reduce the total processing time on a critical resource. Such an objective is aimed at reducing the congestion level at this resource.

Keywords: lot sizing; imperfect yields; process control; rework policy (search for similar items in EconPapers)
Date: 1992
References: Add references at CitEc
Citations: View citations in EconPapers (22)

Downloads: (external link)
http://dx.doi.org/10.1287/mnsc.38.9.1314 (application/pdf)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:inm:ormnsc:v:38:y:1992:i:9:p:1314-1328

Access Statistics for this article

More articles in Management Science from INFORMS Contact information at EDIRC.
Bibliographic data for series maintained by Chris Asher ().