Optimal Test Design for Reliability Demonstration

Shmuel Gal
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Shmuel Gal: IBM Israel Scientific Center, Haifa, Israel

Operations Research, 1974, vol. 22, issue 6, 1236-1242

Abstract: This paper presents the optimal design of tests for demonstrating the reliability of a system, assuming that all the subsystems have a very high reliability so that no failure is expected to occur during the tests.

Date: 1974
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