Interval Estimation After Sequential Testing Based on the Total Time on Test

W. J. Padgett and L. J. Wei
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W. J. Padgett: University of South Carolina, Columbia, South Carolina
L. J. Wei: George Washington University, Washington, D.C.

Operations Research, 1984, vol. 32, issue 3, 726-731

Abstract: Industrial life testing experiments often select m items at random to put on test. The items operate independently and are not replaced upon failure. Assume that the lifetime of each item has a probability distribution depending on an unknown parameter θ, where lifetimes with parameter θ 1 tend to be smaller than lifetimes with parameter θ 2 whenever θ 1 is less than θ 2 . For example, the lifetime distribution can be exponential with mean θ. We develop a time truncated sequential procedure for testing the null hypothesis that θ is at least as large as a specified value θ 0 against the alternative hypothesis that θ is less than θ 0 . The procedure allows quick rejection of the null hypothesis when the alternative is true and provides an accurate confidence interval for θ when the null hypothesis is accepted at the conclusion of the test. After deriving this procedure, we discuss the exponential case and illustrate our results with an example.

Keywords: 726; internal; estimation; after; sequential; testing (search for similar items in EconPapers)
Date: 1984
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