Efficient Algorithms for Scheduling Semiconductor Burn-In Operations

Chung-Yee Lee, Reha Uzsoy and Louis A. Martin-Vega
Additional contact information
Chung-Yee Lee: University of Florida, Gainesville, Florida
Reha Uzsoy: Purdue University, West Lafayette, Indiana
Louis A. Martin-Vega: National Science Foundation, Washington, D.C.

Operations Research, 1992, vol. 40, issue 4, 764-775

Abstract: In this paper, we study the problem of scheduling semiconductor burn-in operations, where burn-in ovens are modeled as batch processing machines. A batch processing machine is one that can process up to B jobs simultaneously. The processing time of a batch is equal to the largest processing time among all jobs in the batch. We present efficient dynamic programming-based algorithms for minimizing a number of different performance measures on a single batch processing machine. We also present heuristics for a number of problems concerning parallel identical batch processing machines and we provide worst case error bounds.

Keywords: dynamic programming/optimal control; applications: dynamic programming applications; production/scheduling; sequencing; deterministic: semiconductor manufacturing (search for similar items in EconPapers)
Date: 1992
References: Add references at CitEc
Citations: View citations in EconPapers (81)

Downloads: (external link)
http://dx.doi.org/10.1287/opre.40.4.764 (application/pdf)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:inm:oropre:v:40:y:1992:i:4:p:764-775

Access Statistics for this article

More articles in Operations Research from INFORMS Contact information at EDIRC.
Bibliographic data for series maintained by Chris Asher ().