Part Dispatch in Random Yield Multistage Flexible Test Systems for Printed Circuit Boards

Ram Akella, S. Rajagopalan and Medini R. Singh
Additional contact information
Ram Akella: Carnegie Mellon University, Pittsburgh, Pennsylvania
S. Rajagopalan: University of Southern California, Los Angeles, California
Medini R. Singh: The University of Michigan, Ann Arbor, Michigan

Operations Research, 1992, vol. 40, issue 4, 776-789

Abstract: This paper concerns dynamic part dispatch decisions in electronic test systems with random yield. A discrete time, multiproduct, miltistage production system is used as a model for the test system with the objective to minimize the sum of inventory holding, backlogging, and overtime costs over a finite horizon. Exact results for such systems have been limited to either single-stage, multiple time period, or multistage, single time period problems with a single product. Here we develop two approximate policies: the linear decision rule, and the myopic resource allocation. The effectiveness of the two policies is evaluated through simulation under different operating conditions representative of those encountered in IBM and Tandem Computer facilities. The extensive computational study clearly demonstrates the overall superiority of the linear decision rule.

Keywords: dynamic programming/optimal control; applications: linear decision rule; industries; computers/electronics: PCB testing; semi-conductor fabrication; inventory/production; multi-item; echelon; stage: dispatch policies for uncertain yield systems (search for similar items in EconPapers)
Date: 1992
References: Add references at CitEc
Citations: View citations in EconPapers (6)

Downloads: (external link)
http://dx.doi.org/10.1287/opre.40.4.776 (application/pdf)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:inm:oropre:v:40:y:1992:i:4:p:776-789

Access Statistics for this article

More articles in Operations Research from INFORMS Contact information at EDIRC.
Bibliographic data for series maintained by Chris Asher ().