Do not adjust your set

Sarah Tomlin

Nature, 1998, vol. 396, issue 6709, 311-311

Abstract: Researchers are for ever looking for ways to increase the resolution achieved by electron microscopes. Tricks used in imaging a silicon crystal by transmission electron microscopy avoid the worst effects of lens aberrations, a limiting factor in achieving better results, and take resolution to the subångström level.

Date: 1998
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DOI: 10.1038/24492

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