Direct evidence for atomic defects in graphene layers

Ayako Hashimoto, Kazu Suenaga (), Alexandre Gloter, Koki Urita and Sumio Iijima
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Ayako Hashimoto: National Institute for Advanced Industrial Science and Technology (AIST)
Kazu Suenaga: National Institute for Advanced Industrial Science and Technology (AIST)
Alexandre Gloter: National Institute for Advanced Industrial Science and Technology (AIST)
Koki Urita: National Institute for Advanced Industrial Science and Technology (AIST)
Sumio Iijima: National Institute for Advanced Industrial Science and Technology (AIST)

Nature, 2004, vol. 430, issue 7002, 870-873

Abstract: Abstract Atomic-scale defects in graphene layers alter the physical and chemical properties of carbon nanostructures1,2. Theoretical predictions have recently shown that energetic particles such as electrons and ions can induce polymorphic atomic defects in graphene layers as a result of knock-on atom displacements3,4. However, the number of experimental reports on these defects is limited5,6. The graphite network in single-walled carbon nanotubes has been visualized by transmission electron microscopy (TEM) and their chiral indices have been determined7,8. But the methods used require a long image acquisition time and intensive numerical treatments after observations to find an ‘average’ image, which prevents the accurate detection and investigation of defect structures. Here we report observations in situ of defect formation in single graphene layers by high-resolution TEM. The observed structures are expected to be of use when engineering the properties of carbon nanostructures for specific device applications.

Date: 2004
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DOI: 10.1038/nature02817

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