Three-dimensional mapping of a deformation field inside a nanocrystal

Mark A. Pfeifer, Garth J. Williams, Ivan A. Vartanyants, Ross Harder and Ian K. Robinson ()
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Mark A. Pfeifer: University of Illinois
Garth J. Williams: University of Illinois
Ivan A. Vartanyants: University of Illinois
Ross Harder: University of Illinois
Ian K. Robinson: University of Illinois

Nature, 2006, vol. 442, issue 7098, 63-66

Abstract: Crystal mapping Synchrotron X-ray radiation, produced by electron accelerators at central facilities, can now be produced in extremely narrow coherent beams. When these X-rays illuminate a crystal of nanometre dimensions a diffraction pattern emerges that is highly resolved. This provides a powerful new tool for structural analysis, as the fine features of the diffraction pattern can be interpreted in terms of sub-atomic distortions within the crystal attributable to its contact with an external support.

Date: 2006
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DOI: 10.1038/nature04867

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