Thermal radiation scanning tunnelling microscopy

Yannick De Wilde (), Florian Formanek, Rémi Carminati, Boris Gralak, Paul-Arthur Lemoine, Karl Joulain, Jean-Philippe Mulet, Yong Chen and Jean-Jacques Greffet
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Yannick De Wilde: Laboratoire d’Optique Physique, Ecole Supérieure de Physique et de Chimie Industrielles, CNRS-UPR A0005
Florian Formanek: Laboratoire d’Optique Physique, Ecole Supérieure de Physique et de Chimie Industrielles, CNRS-UPR A0005
Rémi Carminati: CNRS, Grande Voie des Vignes
Boris Gralak: Institut Fresnel, Faculté des Sciences et Techniques de St Jérôme, CNRS
Paul-Arthur Lemoine: Laboratoire d’Optique Physique, Ecole Supérieure de Physique et de Chimie Industrielles, CNRS-UPR A0005
Karl Joulain: Ecole Nationale Supérieure de Mécanique et d’Aérotechnique
Jean-Philippe Mulet: CNRS, Grande Voie des Vignes
Yong Chen: CNRS
Jean-Jacques Greffet: CNRS, Grande Voie des Vignes

Nature, 2006, vol. 444, issue 7120, 740-743

Abstract: Microscopy hots up The resolution achievable by optical imaging is limited by the wavelength of the light used — the diffraction limit. Near-field scanning optical microscopy circumvents this limit by using a probe smaller than the wavelength of the incident light to map out the electromagnetic field at the sample surface, allowing a resolution well beyond the diffraction limit. Now a variant of this technique has been developed that does away with external illumination altogether. The new technique, called thermal radiation scanning tunnelling microscopy or TRSTM, makes use of the thermal infrared emissions from the sample itself. Think of it as a near-field equivalent of a night-vision camera.

Date: 2006
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DOI: 10.1038/nature05265

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