Radio-frequency scanning tunnelling microscopy

U. Kemiktarak, T. Ndukum, K. C. Schwab and K. L. Ekinci ()
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U. Kemiktarak: Department of Physics,
T. Ndukum: Cornell University, Ithaca, New York 14853, USA
K. C. Schwab: Cornell University, Ithaca, New York 14853, USA
K. L. Ekinci: Boston University, Boston, Massachusetts 02215, USA

Nature, 2007, vol. 450, issue 7166, 85-88

Abstract: STM now on radio The scanning tunnelling microscope (STM) is one of the most useful tools in nanoscience. But a severe limitation of the technique is its time resolution. This is determined not by the fundamental physics of tunnelling, but by the limited high-frequency response of the conventional tunnel current read-out circuitry. The radio-frequency STM uses a specially designed radio-frequency measurement circuit to avoid these measurement bandwidth limitations and work reported in this issue shows that the 'RF-STM' can improve on time resolution by a factor of 100 compared to a state-of-the-art STM. Experimental demonstrations of the new fast-imaging instrument illustrate its suitability for three potential applications — fast surface topography, thermometry at the nanometre scale and nanomechanical displacement sensing.

Date: 2007
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DOI: 10.1038/nature06238

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