Cracks tamed

Antonio J. Pons ()
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Antonio J. Pons: Polytechnic University of Catalonia, Terrassa, Barcelona 08222, Spain.

Nature, 2012, vol. 485, issue 7397, 177-178

Abstract: Crack propagation in materials is rarely welcome. But carefully engineered cracks produced during the deposition of a film on silicon can be used to efficiently create pre-designed patterns of nanometre-scale channels. See Letter p.221

Date: 2012
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DOI: 10.1038/485177a

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