Stimulated X-ray emission for materials science

M. Beye (), S. Schreck, F. Sorgenfrei, C. Trabant, N. Pontius, C. Schüßler-Langeheine, W. Wurth and A. Föhlisch
Additional contact information
M. Beye: Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
S. Schreck: Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
F. Sorgenfrei: Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
C. Trabant: Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
N. Pontius: Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
C. Schüßler-Langeheine: Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany
W. Wurth: Institut für Experimentalphysik, Universität Hamburg and Centre for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany
A. Föhlisch: Institute for Methods and Instrumentation of Synchrotron Radiation Research G-ISRR, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany

Nature, 2013, vol. 501, issue 7466, 191-194

Abstract: Resonant inelastic X-ray scattering requires very high photon densities to detect the relatively weak signals of interest, but here it is demonstrated that inducing stimulated X-ray emission from crystalline silicon can increase the signal level by several orders of magnitude and reduces sample damage.

Date: 2013
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DOI: 10.1038/nature12449

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