Reply to: On the measured dielectric constant of amorphous boron nitride

Seokmo Hong, Min-Hyun Lee, Sang Won Kim, Chang-Seok Lee, Kyung Yeol Ma, Gwangwoo Kim, Seong In Yoon, Aleandro Antidormi, Stephan Roche, Hyeon-Jin Shin (), Manish Chhowalla () and Hyeon Suk Shin ()
Additional contact information
Seokmo Hong: Ulsan National Institute of Science and Technology (UNIST)
Min-Hyun Lee: Samsung Advanced Institute of Technology (SAIT)
Sang Won Kim: Samsung Advanced Institute of Technology (SAIT)
Chang-Seok Lee: Samsung Advanced Institute of Technology (SAIT)
Kyung Yeol Ma: Institute for Basic Science (IBS)
Gwangwoo Kim: Ulsan National Institute of Science and Technology (UNIST)
Seong In Yoon: Institute for Basic Science (IBS)
Aleandro Antidormi: Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST
Stephan Roche: Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST
Hyeon-Jin Shin: Samsung Advanced Institute of Technology (SAIT)
Manish Chhowalla: University of Cambridge
Hyeon Suk Shin: Ulsan National Institute of Science and Technology (UNIST)

Nature, 2021, vol. 590, issue 7844, E8-E10

Date: 2021
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DOI: 10.1038/s41586-020-03163-x

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