On Score Locations of Binary and Partial Credit Items and Their Applications to Item Mapping and Criterion-Referenced Interpretation

Huynh Huynh

Journal of Educational and Behavioral Statistics, 1998, vol. 23, issue 1, 35-56

Abstract: A procedure is presented for locating on the latent trait scale the scores (or responses) of items that follow the three-parameter logistic (3PL) and monotone partial credit (MPC) models. The procedure is based on a Bayesian updating of the item information and is identical to locating the score at the latent trait value that maximizes the Bock score information. Applications are provided in terms of selecting items or score categories for criterion-referenced interpretation and mapping and analyzing score categories.

Keywords: Keywords: Bayesian updating; criterion-referenced measures; item location; item mapping; Likert scale; National Assessment of Educational Progress; ordered categories; partial credit model; scale anchoring; three-parameter logistic model (search for similar items in EconPapers)
Date: 1998
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Citations: View citations in EconPapers (1)

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Persistent link: https://EconPapers.repec.org/RePEc:sae:jedbes:v:23:y:1998:i:1:p:35-56

DOI: 10.3102/10769986023001035

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