Detection of Aberrant Response Patterns and their Effect on Dimensionality

Kikumi K. Tatsuoka and Maurice M. Tatsuoka

Journal of Educational and Behavioral Statistics, 1982, vol. 7, issue 3, 215-231

Abstract: Two indices were developed for measuring the degree of conformity or consistency of an individual examinee’s response pattern on a set of items. The first, called the norm conformity index (NCI), measures the proximity of the pattern to a baseline pattern in which all 0’s precede all l’s when the items are arranged in some prescribed order. The second, called the individual consistency index (ICI), measures the extent to which an individual’s response pattern remains invariant when he or she responds to several waves of parallel items. We show how these two indices, used in conjunction with test scores, can spot aberrant response patterns of students requiring detailed error diagnosis and remedial treatment.

Keywords: Error analysis; individual consistency index (ICI); norm conformity index (NCI); order analysis (search for similar items in EconPapers)
Date: 1982
References: Add references at CitEc
Citations: View citations in EconPapers (3)

Downloads: (external link)
https://journals.sagepub.com/doi/10.3102/10769986007003215 (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:sae:jedbes:v:7:y:1982:i:3:p:215-231

DOI: 10.3102/10769986007003215

Access Statistics for this article

More articles in Journal of Educational and Behavioral Statistics
Bibliographic data for series maintained by SAGE Publications ().