Package mTEXO for testing the presence of outliers in exponential samples

Chien-Tai Lin (), Ying-Chen Lee and Narayanaswamy Balakrishnan
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Chien-Tai Lin: Tamkang University
Ying-Chen Lee: Tamkang University
Narayanaswamy Balakrishnan: McMaster University

Computational Statistics, 2019, vol. 34, issue 2, No 18, 803-818

Abstract: Abstract We develop an user-interface package mTEXO in the Maplet application for testing exponential upper and/or lower outliers. The distributions of some well-known test statistics for exponential outliers in the literature can be easily evaluated using mTEXO, saving considerable computational time performing numerical integrations and combinatorial algebra necessary in the traditional approach.

Keywords: Critical value; Discordancy test; Exponential distribution; Spacings; User interface (search for similar items in EconPapers)
Date: 2019
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DOI: 10.1007/s00180-018-0843-6

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