Fault isolation by test scheduling for embedded systems using a probabilistic approach

Daoud Aït-Kadi (), Zineb Simeu-Abazi () and Ahmed Arous ()
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Daoud Aït-Kadi: Université Laval
Zineb Simeu-Abazi: Université Joseph Fourier
Ahmed Arous: Université Laval

Journal of Intelligent Manufacturing, 2018, vol. 29, issue 3, No 13, 649 pages

Abstract: Abstract This paper deals with isolation of failed components in the system. Each component can be affected in a random way by failures. The state of a component or a subsystem is detected using tests. The goal of this paper is to exploit the techniques of built-in tests and available knowledge to generate the sequence of tests required to locate quickly all the components responsible for system failure. We consider an operative system according to a series structure for which we know test cost and the conditional probability that a component is responsible for the failure. The various diagnosis strategies are analyzed. The treated algorithms relay on system probabilistic analysis.

Keywords: Detection; Cost; Probabilistic approach; Embedded systems; Built-in-test; Diagnostic (search for similar items in EconPapers)
Date: 2018
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DOI: 10.1007/s10845-015-1088-7

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