Defect identification in friction stir welding using continuous wavelet transform

Shilpi Kumari, Rahul Jain, Ujjwal Kumar, Inderjeet Yadav, Nitin Ranjan, Kanchan Kumari, Ram Kumar Kesharwani, Sachin Kumar, Srikanta Pal, Surjya K. Pal () and Debashish Chakravarty
Additional contact information
Shilpi Kumari: Birla Institute of Technology, Mesra
Rahul Jain: Indian Institute of Technology
Ujjwal Kumar: Birla Institute of Technology, Mesra
Inderjeet Yadav: Birla Institute of Technology, Mesra
Nitin Ranjan: Birla Institute of Technology, Mesra
Kanchan Kumari: Indian Institute of Technology
Ram Kumar Kesharwani: Indian Institute of Technology
Sachin Kumar: Indian Institute of Technology
Srikanta Pal: Birla Institute of Technology, Mesra
Surjya K. Pal: Indian Institute of Technology
Debashish Chakravarty: Indian Institute of Technology

Journal of Intelligent Manufacturing, 2019, vol. 30, issue 2, No 2, 483-494

Abstract: Abstract The manuscript reports on detection of defect that arises during friction stir welding using continuous wavelet transform (CWT) on force signal. The vertical force during welding undergoes sudden change due to presence of defects. These localized defects are detected accurately with the help of continuous wavelet transform scalogram (CWT coefficients’ gray scale image). Statistical feature of variance is used on scale of 1 of transformed signal to localize the defects. The experiments of welding are conducted on the work piece of AA 1100 with varying tool rotational speed (1000, 2000, 3000 rpm) and transverse velocity (50, 75 and 125 mm/min). The manuscript also presents the comparison of results obtained using discrete wavelet transform and CWT of force signals and shows better localization and determination of degree of defect are possible through CWT analysis.

Keywords: Continuous wavelet transform; Friction stir welding; Force signal; Weld defects (search for similar items in EconPapers)
Date: 2019
References: View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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DOI: 10.1007/s10845-016-1259-1

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