Correction: Detecting and classifying hidden defects in additively manufactured parts using deep learning and X-ray computed tomography

Miles V. Bimrose, Tianxiang Hu, Davis J. McGregor, Jiongxin Wang, Sameh Tawfick, Chenhui Shao, Zuozhu Liu and William P. King ()
Additional contact information
Miles V. Bimrose: University of Illinois Urbana-Champaign
Tianxiang Hu: Zhejiang University
Davis J. McGregor: University of Illinois Urbana-Champaign
Jiongxin Wang: Zhejiang University
Sameh Tawfick: University of Illinois Urbana-Champaign
Chenhui Shao: University of Illinois Urbana-Champaign
Zuozhu Liu: Zhejiang University
William P. King: University of Illinois Urbana-Champaign

Journal of Intelligent Manufacturing, 2025, vol. 36, issue 5, No 27, 3481 pages

Date: 2025
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DOI: 10.1007/s10845-024-02466-4

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