Sequential estimation of means of linear processes

N. Mukhopadhyay

Metrika: International Journal for Theoretical and Applied Statistics, 1995, vol. 42, issue 1, 279-290

Keywords: One sample problem; multi-sample problem; minimum risk point estimation; fixed-width confidence intervals; purely sequential sampling; accelerated sequential sampling; operational savings (search for similar items in EconPapers)
Date: 1995
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DOI: 10.1007/BF01894327

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