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H. Heyer, H. Rieder, F. Papangelou, A. Janssen, L. Rüschendorf, R. Hudson and A. Greven

Metrika: International Journal for Theoretical and Applied Statistics, 1996, vol. 44, issue 1, 84-93

Date: 1996
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DOI: 10.1007/BF02614056

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