Statistical inference in simplicially contoured sample distributions

Volkmar Henschel ()

Metrika: International Journal for Theoretical and Applied Statistics, 2002, vol. 56, issue 3, 215-228

Abstract: For generalizations of the n-dimensional two parameter exponential distribution with identical marginals with threshold and dispersion parameters the exact distributions of estimators and test statistics are given. Under cer-tain conditions the consistency of the estimators and the rate of convergence is shown. Therefore generalized Gamma- and F-distributions are defined. Copyright Springer-Verlag 2002

Keywords: Exponential and l 1 -norm symmetric distributions; exact distributions of estimators and test statistics; rate of convergence (search for similar items in EconPapers)
Date: 2002
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Persistent link: https://EconPapers.repec.org/RePEc:spr:metrik:v:56:y:2002:i:3:p:215-228

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DOI: 10.1007/s001840100174

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