Inference on Reliability in Two-parameter Exponential Stress–strength Model
K. Krishnamoorthy (),
Shubhabrata Mukherjee and
Huizhen Guo ()
Metrika: International Journal for Theoretical and Applied Statistics, 2007, vol. 65, issue 3, 273 pages
Keywords: Coverage probability; Generalized confidence limit; Generalized p-value; Location-scale invariance; Pareto distribution; Power distribution; Size (search for similar items in EconPapers)
Date: 2007
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Persistent link: https://EconPapers.repec.org/RePEc:spr:metrik:v:65:y:2007:i:3:p:261-273
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DOI: 10.1007/s00184-006-0074-7
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