A generalized correlated binomial distribution with application in multiple testing problems

Ramesh Gupta () and Hui Tao ()

Metrika: International Journal for Theoretical and Applied Statistics, 2010, vol. 71, issue 1, 59-77

Keywords: Correlated binomial model; Beta-binomial model; False discovery rates (FDR); Multiple testing (search for similar items in EconPapers)
Date: 2010
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DOI: 10.1007/s00184-008-0202-7

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