Estimation of parameters of parallelism model with elliptically distributed errors

M. Arashi, A. Saleh () and S. Tabatabaey

Metrika: International Journal for Theoretical and Applied Statistics, 2010, vol. 71, issue 1, 79-100

Keywords: Parallelism model; Elliptically contoured distribution; Inverse Laplace transform; Signed measure; Preliminary test estimator; Stein-type shrinkage estimator; Positive-rule shrinkage estimator; Weighted quadratic loss function (search for similar items in EconPapers)
Date: 2010
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Citations: View citations in EconPapers (4)

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DOI: 10.1007/s00184-008-0203-6

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