Robust Bayesian Pitman closeness
Jafar Ahmadi (),
Elham Mirfarah () and
Ahmad Parsian ()
Additional contact information
Jafar Ahmadi: Ordered and Spatial Data Center of Excellence, Ferdowsi University of Mashhad
Elham Mirfarah: Ferdowsi University of Mashhad
Ahmad Parsian: University of Tehran
Metrika: International Journal for Theoretical and Applied Statistics, 2016, vol. 79, issue 6, No 3, 691 pages
Abstract:
Abstract In this paper, the robust Bayesian methodology has been developed in the sense of Pitman measure of closeness. To do this, the definition of Pitman posterior closeness, introduced by Ghosh and Sen (Commun Stat Theory Methods 20:3659–3678, 1991) and simultaneous closeness are integrated. First, the $$\varGamma $$ Γ -minimax problem is developed in the sense of Pitman’s criterion and the basic results and definitions are provided. Then, several results regarding Pitman $$\varGamma $$ Γ -minimax have been proved. Some examples have been presented to illustrate the application of the findings. Finally, other aspect of robust Bayesian methodology such as: Pitman stable rules and Pitman regret type estimators have been proposed.
Keywords: Robust Bayes estimators; $$\varGamma $$ Γ -Minimax rules; Pitman measure of closeness; Order statistics; Quantile (search for similar items in EconPapers)
Date: 2016
References: View references in EconPapers View complete reference list from CitEc
Citations:
Downloads: (external link)
http://link.springer.com/10.1007/s00184-015-0572-6 Abstract (text/html)
Access to the full text of the articles in this series is restricted.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:spr:metrik:v:79:y:2016:i:6:d:10.1007_s00184-015-0572-6
Ordering information: This journal article can be ordered from
http://www.springer.com/statistics/journal/184/PS2
DOI: 10.1007/s00184-015-0572-6
Access Statistics for this article
Metrika: International Journal for Theoretical and Applied Statistics is currently edited by U. Kamps and Norbert Henze
More articles in Metrika: International Journal for Theoretical and Applied Statistics from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().