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Special Issue with papers from the “3rd workshop on Goodness-of-fit and change-point problems”

N. Henze (), C. Kirch and S. G. Meintanis
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N. Henze: Karlsruhe Institute of Technology (KIT)
C. Kirch: Otto-von-Guericke University (OvGU)
S. G. Meintanis: National and Kapodistrian University of Athens

Metrika: International Journal for Theoretical and Applied Statistics, 2018, vol. 81, issue 6, No 1, 587-588

Date: 2018
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DOI: 10.1007/s00184-018-0677-9

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