Identification of models using failure rate and mean residual life of doubly truncated random variables

P. Sankaran and S. Sunoj

Statistical Papers, 2004, vol. 45, issue 1, 97-109

Keywords: Failure rate; Mean Residual Life; Length biased models (search for similar items in EconPapers)
Date: 2004
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Citations: View citations in EconPapers (9)

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DOI: 10.1007/BF02778272

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