EconPapers    
Economics at your fingertips  
 

Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan

R. Vijayaraghavan and V. Soundararajan

Journal of Applied Statistics, 1998, vol. 25, issue 3, 341-348

Abstract: This paper presents a design for skip-lot sampling inspection plans with the double-sampling plan as the reference plan, so as to reduce the sample size and produce more efficient plans in return for the same sampling effort. The efficiency of the proposed plan compared with that of the conventional double-sampling plan is also discussed. The need for smaller acceptance numbers under the plan is highlighted. Methods of selecting the plan indexed by the acceptable quality level and limiting quality level, and by the acceptable quality level and average outgoing quality level are also presented.

Date: 1998
References: View complete reference list from CitEc
Citations: View citations in EconPapers (2)

Downloads: (external link)
http://www.tandfonline.com/doi/abs/10.1080/02664769823070 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:taf:japsta:v:25:y:1998:i:3:p:341-348

Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/CJAS20

DOI: 10.1080/02664769823070

Access Statistics for this article

Journal of Applied Statistics is currently edited by Robert Aykroyd

More articles in Journal of Applied Statistics from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().

 
Page updated 2025-03-20
Handle: RePEc:taf:japsta:v:25:y:1998:i:3:p:341-348