Assessing risk for rare events
Yssa Dewoody,
V. T. Gururaj and
Clyde Martin
Journal of Applied Statistics, 1999, vol. 26, issue 6, 681-687
Abstract:
This paper develops a method for assessing the risk for rare events based on the following scenario. There exists a large population with an unknown percentage p of defects. A sample of size N is drawn from the population and, in the sample, 0 defects are drawn. Given these data, we want to determine the probability that no more than n defects will be found in another random sample of N drawn from the population. Estimates on the range of p and n are calculated from a derived joint distribution which depends on p, n and N. Asymptotic risk results based on an infinite sample are then developed. It is shown that these results are applicable even with relatively small sample spaces.
Date: 1999
References: Add references at CitEc
Citations:
Downloads: (external link)
http://www.tandfonline.com/doi/abs/10.1080/02664769922124 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:taf:japsta:v:26:y:1999:i:6:p:681-687
Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/CJAS20
DOI: 10.1080/02664769922124
Access Statistics for this article
Journal of Applied Statistics is currently edited by Robert Aykroyd
More articles in Journal of Applied Statistics from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().